IEEE 300-1988 PDF

$107.00

IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
standard by IEEE, 12/29/1988

Document Format: PDF

Description

Revision Standard – Inactive-Reserved.

Product Details

Published:
12/29/1988
ISBN(s):
0738106747, 9780738106748
Number of Pages:
35
File Size:
1 file , 460 KB
Product Code(s):
STDRES12286
Note:
This product is unavailable in Russia, Belarus