Description
IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).
Product Details
- Edition:
- 1.0
- Published:
- 05/27/2020
- Number of Pages:
- 15
- File Size:
- 1 file , 1.6 MB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
