Description
This measurement procedure describes a measurement method to quantify the RF immunity of integrated circuits (ICs) mounted on a standardized test board or on their final application board (PCB), to electromagnetic conductive disturbances.
Product Details
- Edition:
- 1.0
- Published:
- 10/10/2005
- Number of Pages:
- 45
- File Size:
- 1 file , 660 KB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
