IEC 62047-40 Ed. 1.0 en:2021 PDF

$31.00

Semiconductor devices – Micro-electromechanical devices – Part 40: Test methods of micro-electromechanical inertial shock switch threshold
standard by International Electrotechnical Commission, 09/01/2021

Document Format: PDF

Description

This part of IEC 62047 specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open microelectromechanical inertial shock switch.

Product Details

Edition:
1.0
Published:
09/01/2021
ISBN(s):
9782832210187
Number of Pages:
16
File Size:
1 file , 1.2 MB
Note:
This product is unavailable in Ukraine, Russia, Belarus