Description
Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz.
Product Details
- Edition:
- 1.0
- Published:
- 06/25/2002
- Number of Pages:
- 51
- File Size:
- 1 file , 750 KB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
