Description
IEC 60749-40:2011 is intended to evaluate and compare drop performance of a surface mount semiconductor device for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure. The purpose is to standardize test methodology to provide a reproducible assessment of the drop test performance of a surface mounted semiconductor devices while duplicating the failure modes normally observed during product level test. This international standard uses a strain gauge to measure the strain and strain rate of a board in the vicinity of a component.
Product Details
- Edition:
- 1.0
- Published:
- 07/13/2011
- Number of Pages:
- 44
- File Size:
- 1 file , 840 KB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
