IEC 60749-37 Ed. 1.0 b:2008 PDF

$80.00

Semiconductor devices – Mechanical and climatic test methods – Part 37: Board level drop test method using an accelerometer
standard by International Electrotechnical Commission, 01/30/2008

Document Format: PDF

Description

Provides a test method that is intended to evaluate and compare drop performance of surface mount electronic components for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure. The purpose is to standardize the test board and test methodology to provide a reproducible assessment of the drop test performance of surface-mounted components while producing the same failure modes normally observed during product level test.

Product Details

Edition:
1.0
Published:
01/30/2008
Number of Pages:
39
File Size:
1 file , 1 MB
Note:
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