Description
IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.
Product Details
- Edition:
- 1.0
- Published:
- 05/20/2019
- Number of Pages:
- 26
- File Size:
- 1 file , 2.3 MB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
