Description
Describes equipment and procedures to be used for SEM inspection of discrete semiconductor devices and integrated circuits.
Product Details
- Published:
- 08/30/1985
- ISBN(s):
- 0580146022
- Number of Pages:
- 24
- File Size:
- 1 file , 820 KB
- Product Code(s):
- 140153, 140153, 00140153
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
