Description
Product Details
- Published:
- 12/01/2010
- Number of Pages:
- 7
- File Size:
- 1 file , 160 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
ASTM F980-10e1 PDF
$35.00
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
standard by ASTM International, 12/01/2010
Document Format: PDF
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