Description
1.1 This terminology is related to the various disciplines involved in surface analysis.
1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).
Product Details
- Published:
- 07/10/2002
- Number of Pages:
- 10
- File Size:
- 1 file , 93 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
