Description
1.1 This guide covers the preferred procedure for acquiring and post-processing of sputter crater depth measurements. This guide is limited to stylus-type surface profilometers equipped with a stage, stylus, associated scan and sensing electronics, video system for sample and scan alignment, and computerized system.
Product Details
- Published:
- 11/01/2019
- Number of Pages:
- 3
- File Size:
- 1 file , 160 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
