Description
1.1”This practice provides the minimum requirements for nondestructive radiographic examination of semiconductor devices, microelectronic devices, electromagnetic devices, electronic and electrical devices, and the materials used for construction of these items.
Product Details
- Published:
- 06/01/2021
- Number of Pages:
- 11
- File Size:
- 1 file , 260 KB
- Redline File Size:
- 2 files , 550 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
