Description
Product Details
- Published:
- 01/01/1998
- File Size:
- 1 file , 320 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
JIS R 1637:1998 PDF
$19.00
Test method for resistivity of conductive fine ceramic thin films with a four-point probe array
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1998
Document Format: PDF
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