IEEE 218-1956 PDF

$31.00

IEEE Standard Methods of Testing Transistors
standard by IEEE, 11/30/1955

Document Format: PDF

Description

New IEEE Standard – Inactive-Withdrawn.

Product Details

Published:
11/30/1955
ISBN(s):
9781504402095
Number of Pages:
6
File Size:
1 file , 3.5 MB
Product Code(s):
STDWD02568
Note:
This product is unavailable in Russia, Belarus