Description
Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed. The testing shall be selected from this test method or the human body model (see IEC 60749-26).
Product Details
- Edition:
- 1.0
- Published:
- 10/21/2003
- Number of Pages:
- 25
- File Size:
- 1 file , 1.4 MB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
