IEC 60749-8 Ed. 1.0 b:2002 PDF

$57.00

Semiconductor devices – Mechanical and climatic test methods – Part 8: Sealing
standard by International Electrotechnical Commission, 08/30/2002

Document Format: PDF

Description

Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.

Product Details

Edition:
1.0
Published:
08/30/2002
Number of Pages:
31
File Size:
1 file , 560 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus