IEC 63287-2 Ed. 1.0 b:2023 PDF

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Semiconductor devices – Guidelines for reliability qualification plans – Part 2: Concept of mission profile
standard by International Electrotechnical Commission, 03/01/2023

Document Format: PDF

Description

This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.

Product Details

Edition:
1.0
Published:
03/01/2023
ISBN(s):
9782832267080
Number of Pages:
34
File Size:
1 file , 930 KB
Note:
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